Characterization of InAs nanowires strained by AFM manipulation
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Shear stress measurements on InAs nanowires by AFM manipulation.
Submitted for the MAR07 Meeting of The American Physical Society Shear stress measurements on InAs nanowires by AFM manipulation HAKAN PETTERSSON, Halmstad University, M. BORDAG, Leipzig University, A. RIBAYROL, G. CONANCHE, L.E. FRÖBERG, L. SAMUELSON, L. MONTELIUS, Lunds University — In this paper, we report on a novel approach to measure shear stress between elastic nanowires and a SiO2 surfa...
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تاریخ انتشار 2013